Application-specific integrated circuit (ASIC) for use in...
Architecture and method for testing of an integrated circuit...
Architecture for built-in self-test of parallel optical...
Architecture of an efficient at-speed programmable memory...
Architecture, circuitry and method for testing one or more...
Area efficient memory architecture with decoder self test...
Area optimized edge-triggered flip-flop for high-speed...
Arithmetic built-in self-test of multiple scan-based...
Arrangement and method of testing an integrated circuit
Arrangement and method of testing an integrated circuit
Arrangement for testing integrated circuits
ASIC BIST employing stored indications of completion
ASIC logic BIST employing registers seeded with differing...
Assembly and method for testing integrated circuit devices
Assembly for LSI test and method for the test
Asynchronous bist for embedded multiport memories
Asynchronous communication apparatus using JTAG test data...
Asynchronous debug interface
Asynchronous integrated circuit tester
Asynchronous set-reset circuit device