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Observability register architecture for efficient production...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Offset test pattern apparatus and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On chip data comparator with variable data and compare...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On chip programmable data pattern generator for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On-board FIFO memory module for high speed digital sourcing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On-chip and at-speed tester for testing and characterization...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On-chip and at-speed tester for testing and characterization...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On-chip circuitry for bus validation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On-chip comparison and response collection tools and techniques

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On-chip debugger

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On-chip design for monitor

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On-chip high-speed serial data analyzers, systems, and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On-chip high-speed serial data analyzers, systems, and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On-chip interface trap characterization and monitoring

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On-chip jitter testing

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On-chip method and apparatus for testing semiconductor circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On-chip sampling circuit and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On-chip sampling circuit and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On-chip sampling circuit and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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On-chip sampling circuit and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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