Architecture and method for testing of an integrated circuit...

Details Architecture and method for testing of an integrated circuit... Architecture and method for testing of an integrated circuit...

2005-08-19

2008-10-28

Chung, Phung M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S724000

Reexamination Certificate

active

07444575

ABSTRACT:
In one embodiment, the present invention provides a platform of hardware and/or software that enables the complete access and reliable testing of multiple integrated circuit (IC) devices within a package. This platform may include a testing component (e.g., test circuits, test pads, shared pads, etc.), one or more probe cards and related hardware, wafer probe programs, load board and related hardware of external test equipment, and software and routines for final test programs.

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