I/O device testing method and apparatus
I/O switches and serializer for each parallel scan register
I2C test single chip
IBIST test for synchronous lines at multiple frequencies
IC chip tester using compressed digital test data and a method f
IC functional and delay fault testing
IC input memory with dual data and dual control inputs
IC multiplexer control circuitry for tap selection circuitry
IC tap/scan test port access with tap lock circuitry
IC test cell with memory output connected to input multiplexer
IC test equipment, measurement method in the IC test equipment,
IC test software system for mapping logical functional test...
IC test system and storage medium for the same
IC tester
IC tester having region in which various test conditions are...
IC testing apparatus and method
IC testing methods and apparatus
IC testing methods and apparatus
IC with addressable test port
IC with cache bit memory in series with scan segment