1114.9 tap linking modules
1149.1 tap linking modules
ABIST data compression and serialization for memory built-in...
ABIST data compression and serialization for memory built-in...
ABIST-assisted detection of scan chain defects
AC coupled line testing using boundary scan test methodology
AC coupled line testing using boundary scan test methodology
AC LSSD/LBIST test coverage enhancement
AC propagation testing preventing sampling test data at...
AC scan diagnostic method
Accelerated scan circuitry and method for reducing scan test...
Accelerated scan circuitry and method for reducing scan test...
Accelerated scan circuitry and method for reducing scan test...
Accelerating scan test by re-using response data as stimulus...
Accelerating scan test by re-using response data as stimulus...
Access method for embedded JTAG TAP controller instruction...
Accessing sequential data in a microcontroller
Accessing sequential data in a microcontroller
Accessing test modes using command sequences
Accurately identifying failing scan bits in compression...