LandOfFree - US Patents - Listing for Error detection/correction and fault detection/recovery,Pulse or data error handling,Digital logic testing

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Wafer scale testing using a 2 signal JTAG interface

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Wafer scale testing using a 2 signal JTAG interface

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Waveform controller for an IC tester

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Waveform generator, semiconductor testing device and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Weighted random pattern built-in self-test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Patent

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Wireless embedded test signal generation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Wireless method and apparatus for testing armament circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Wireless no-touch testing of integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Wrapped core linking module for accessing system on chip test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Wrapper instruction/data register controls from test access...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Wrapper leads gating TAP instruction and data registers

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Wrapper serial scan chain functional segmentation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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