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N-squared algorithm for optimizing correlated events

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Networked test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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NLTS correction circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Noisy channel emulator for high speed data

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Non-binary address generation for ABIST

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Non-volatile fault indicator

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Numeric intensive development environment

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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