Macro-cell flip-flop with scan-in input
Maintaining data coherency in multi-clock systems
Maintenance free test system
Maintenance registers with Boundary Scan interface
Manipulation of hardware control status registers via...
Manufacturing testing of hot-plug circuits on a computer...
Mapping logic for controlling loading of the select ram of...
Mapping logic for loading control of crossbar multiplexer...
Mask network design for scan-based integrated circuits
Master controller architecture
Master-slave-type scanning flip-flop circuit for high-speed...
Match circuit for performing pattern recognition in a...
Match circuit for performing pattern recognition in a...
Means for testing dynamic integrated circuits
Means scanning scan path parts sequentially and capturing...
Means scanning scan path parts sequentially and capturing...
Measurement circuit and method for serially merging...
Measuring bridge-fault coverage for test patterns within...
Measuring microprocessor susceptibility to internal noise...
Measuring propagation delays of programmable logic devices