Easy to program automatic test equipment

Edge-triggered master + LSSD slave binary latch

Edge-triggered scan flip-flop and one-pass scan synthesis...

Efficient built-in self test for embedded memories with differin

Efficient compression and application of deterministic...

Efficient on-pitch scannable sense amplifier

Efficient scan chain insertion using broadcast scan for...

Efficient word recognizer for a logic analyzer

eFuse programming data alignment verification apparatus and...

Electrical circuit and method for testing a circuit...

Electrical circuit unit and a method for testing the...

Electrical diagnostic circuit and method for the testing...

Electronic circuit and integrated circuit including scan...

Electronic circuit and method for testing

Electronic circuit comprising a test mode secured by...

Electronic circuit testing methods and apparatus

Electronic circuit with asynchronously operating components

Electronic circuit with asynchronously operating components

Electronic device selectably operable as a sequential logic circ

Electronic element comprising an electronic circuit which is...