Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-08-08
2006-08-08
Ton, David (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S742000
Reexamination Certificate
active
07089467
ABSTRACT:
Apparatus and methods are described for a background microcontroller debugger. A method to debug a microcontroller includes sending a three level signal from a debug module, receiving the three level signal at a single pin on an MCU, sending a second three level signal from the single pin on the MCU, and receiving the second three level signal at the debug module. An apparatus to debug a microcontroller includes a tri-statable pad driver to transmit a three level signal, a reference voltage divider coupled to the tri-statable pad diver, a plurality of voltage comparators to receive the three level signal, a resistive voltage divider to maintain thresholds for the plurality of voltage comparators, and a plurality of logic elements coupled to the plurality of voltage comparators to receive the three level signal.
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Freescale Semiconductor Inc.
Fulbright & Jaworski LLP
Ton David
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