LandOfFree - US Patents - Listing for Error detection/correction and fault detection/recovery,Pulse or data error handling,Digital logic testing

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Fabrication of test logic for level sensitive scan on a circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Patent

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Fail array memory control circuit with selective input disable

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Failure analysis and testing of semi-conductor devices using...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Failure analysis and testing of semi-conductor devices using...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Failure analysis and testing of semi-conductor devices using...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Failure analysis device for IC tester and memory device measurin

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Patent

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Failure analysis system and failure analysis method of logic...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Failure capture apparatus and method for automatic test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Failure diagnostic apparatus, failure diagnostic system, and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Failure isolation and repair techniques for integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Failure prediction circuit and method, and semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Fast error diagnosis for combinational verification

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Fast sampling test bench

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Fast scannable output latch with domino logic input

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Fast-scan-flop and integrated circuit device incorporating...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Fault coverage and simplified test pattern generation for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Fault detecting method and layout method for semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Fault detecting method and layout method for semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Fault detection method and apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Fault detection method for electronic circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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