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Uniform testing of tristate nets in logic BIST

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Universal method and apparatus for controlling a functional...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Use of a scan chain for configuration of BIST unit operation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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User available body scan chain

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Using clock gating or signal gating to partition a device...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Using statistical signatures for testing high-speed circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Utilizing multiple bitstreams to avoid localized defects in...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Utilizing multiple test bitstreams to avoid localized...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Utilizing multiple test bitstreams to avoid localized...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Utilizing multiple test bitstreams to avoid localized...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Utilizing serializer-deserializer transmit and receive pads...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Utilizing slow ASIC logic BIST to preserve timing integrity...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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