Uniform testing of tristate nets in logic BIST
Universal method and apparatus for controlling a functional...
Use of a scan chain for configuration of BIST unit operation
User available body scan chain
Using clock gating or signal gating to partition a device...
Using statistical signatures for testing high-speed circuits
Utilizing multiple bitstreams to avoid localized defects in...
Utilizing multiple test bitstreams to avoid localized...
Utilizing multiple test bitstreams to avoid localized...
Utilizing multiple test bitstreams to avoid localized...
Utilizing serializer-deserializer transmit and receive pads...
Utilizing slow ASIC logic BIST to preserve timing integrity...