Built-in-self-repair arrangement for a single...
Built-in-self-test circuit for RAMBUS direct RDRAM
Built-in-self-test using embedded memory and processor in an...
Built-in-test diagnostic and maintenance support system and...
Burn in technique for chips containing different types of IC cir
Burn-in test circuit, burn-in test method, burn-in test...
Bus mastering debugging system for integrated circuits
Bypassing a device in a scan chain
Calibration method and apparatus for correcting pulse width...
Calibration system that can be utilized with a plurality of...
Capturing and evaluating high speed data streams
Centralized BIST engine for testing on-chip memory structures
Centralized BIST engine for testing on-chip memory structures
CGROM testing device
Changing scan paths shifting by changing mode select input...
Characterizing jitter sensitivity of a...
Chip performance optimization with self programmed built in...
Chip testing apparatus and method
Chip testing system
Circuit and method for adding parametric test capability to...