Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2001-07-30
2008-08-26
Chung, Phung M (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S734000
Reexamination Certificate
active
07418642
ABSTRACT:
A test method for an ASIC uses an embedded processor in the ASIC to execute test routines from an embedded memory or an external memory. During ASIC production, the test routines can comprehensively test of the blocks of the ASIC without a complicated test pattern from test equipment. The test routines can also perform power-up tests in systems or end products containing the ASIC. Test selection, activation, and result output can be implement using a few terminals of the ASIC.
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Bodily Melvin D.
Marshall John D.
Montierth Mark D.
Taylor Richard D.
Zimmerman Gary
Chung Phung M
Marvell International Technology Ltd.
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