Burn in technique for chips containing different types of IC cir

Details Burn in technique for chips containing different types of IC cir Burn in technique for chips containing different types of IC cir

1998-08-25

2000-09-19

Tu, Christine

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

714738, G01R 3128

Patent

active

061227609

ABSTRACT:
An improved technique for testing semi-conductor chips having different types of circuits thereof is provided. The burn-in test includes providing test engines and/or externally applied patterns for each of the different types of circuits, stressing at high temperature and increased voltage, the semi-conductor containing both types of circuits, and running a sequence of patterns on each of said types of circuits simultaneously by the use of the engines for at least one of the types of circuits.

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