Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-01-02
2007-01-02
Tu, Christine T. (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S734000
Reexamination Certificate
active
10414309
ABSTRACT:
A boundary scan cell for use in a circuit having a boundary scan shift register (BSSR) having boundary scan cells associated with pins of the circuit, the cell having a single-bit shift register element and an associated update latch, comprises a logic circuit for controlling the logic state of an associated pin, analog switches connecting the associated pin to analog test buses, and logic circuitry for selectively configuring the cell in a parametric test mode in which the cell shift register element controls the analog switches, and in a digital test mode in which the cell shift register element controls the logic state of the associated pin.
REFERENCES:
patent: 4625310 (1986-11-01), Mercer
patent: 5220281 (1993-06-01), Matsuki, Koji
patent: 5225834 (1993-07-01), Imai et al.
patent: 5404358 (1995-04-01), Russell
patent: 5477493 (1995-12-01), Danbayashi
patent: 5744949 (1998-04-01), Whetsel
patent: 6104198 (2000-08-01), Brooks
patent: 6199182 (2001-03-01), Whetsel
patent: 6262585 (2001-07-01), Frodsham et al.
patent: 6327122 (2001-12-01), Pinarbasi
patent: 6446230 (2002-09-01), Chung
patent: 6499124 (2002-12-01), Jacobson
patent: 2002/0120895 (2002-08-01), Suzuki
Lofstrom, Keith, “A Demonstration IC for the P1149.4 Mixed Signal Test Standard”, 1996 ITC Proceedings.
Parker et. al., “Design, Fabrications and Use of Mixed-Signal IC Testability Structures”, 1997 ITC Proceedings.
LogicVision, Inc.
Prouix Eugene E.
Tu Christine T.
LandOfFree
Circuit and method for adding parametric test capability to... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Circuit and method for adding parametric test capability to..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Circuit and method for adding parametric test capability to... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3804571