Burn-in test circuit, burn-in test method, burn-in test...

Details Burn-in test circuit, burn-in test method, burn-in test... Burn-in test circuit, burn-in test method, burn-in test...

2011-01-18

2011-01-18

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S716000

Reexamination Certificate

active

07873887

ABSTRACT:
A burn-in test circuit according to the present invention includes a scan chain formed by a plurality of scan flip-flips connected in series, a circuit under test input with an output from one of the plurality of scan flip-flops as an activation signal, and a scan chain loop circuit being configured to an output signal of the scan chain determined according to an output of the circuit under test back to the scan chain.

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