Calibration system that can be utilized with a plurality of...

Details Calibration system that can be utilized with a plurality of... Calibration system that can be utilized with a plurality of...

2005-05-12

2009-12-29

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S724000

Reexamination Certificate

active

07640477

ABSTRACT:
A calibration system within a test system is disclosed. The calibration system may include a netlist, a path correction module, and a processor in signal communication with the path correction module. The netlist may include a list of electrical characteristics of components in the test system and a topology of the test system. The calibration system can be used with a variety of test system topologies.

REFERENCES:
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patent: 6952816 (2005-10-01), Gupta et al.
patent: 2004/0076139 (2004-04-01), Kang-Yeh et al.
patent: 2004319828 (2004-11-01), None
Huang, Wu, Liu, Tsai, Wang, Chiueh, Boundary Scan for 5-GHz RF Pins Using LC Isolation Networks 2004, IEEE, 22ndIEEE VLSI Test Symposium.
GB Search Report Under Section 17 dated Aug. 30, 2006.
Jim Fitzpatrick, Hewlett-Packard Company, Santa Rosa, California—“Error Models For Systems Measurement”, Microwave Journal, May 1978, pp. 63-66.

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