Bypassing a device in a scan chain

Details Bypassing a device in a scan chain Bypassing a device in a scan chain

2007-07-17

2007-07-17

Chung, Phung My (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S726000, C714S727000, C714S014000, C714S036000

Reexamination Certificate

active

10607159

ABSTRACT:
Methods and systems for testing devices in a scan chain are described. A first device for test and a second device for test are coupled in the scan chain. A signal selector is coupled between the first and second devices. The signal selector selects between an output signal that is output from the first device and a bypass signal that has bypassed the first device.

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