Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-12-17
2011-11-08
Gaffin, Jeffrey A (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S718000
Reexamination Certificate
active
08055966
ABSTRACT:
A multiple integrated circuit arrangement within a single package is provided. The multiple integrated circuit arrangement includes a set of electronic components, which includes at least a set of dies. The first die of the set of dies is coupled to a first electronic component of the set of electronic components, wherein the first electronic component is not the first die. The arrangement includes a built-in-self-test (BIST) arrangement, which is at least partly encapsulated within the single package, wherein the BIST arrangement is configured for at least testing the first die of the set of dies. The arrangement also includes a built-in-self-repair (BISR) arrangement, which is at least partly encapsulated within the single package, wherein the BISR arrangement is configured for at least repairing the multiple integrated circuit arrangement.
REFERENCES:
patent: 5570035 (1996-10-01), Dukes et al.
patent: 6240535 (2001-05-01), Farnworth et al.
patent: 6351681 (2002-02-01), Chih et al.
patent: 6469534 (2002-10-01), Kimura
patent: 6651202 (2003-11-01), Phan
patent: 6734693 (2004-05-01), Nakayama
patent: 6876221 (2005-04-01), Ishigaki
patent: 7075175 (2006-07-01), Kazi et al.
patent: 7383475 (2008-06-01), Corbin
patent: 7795894 (2010-09-01), Sogani
patent: 2006/0248424 (2006-11-01), Colunga et al.
patent: 2009/0052267 (2009-02-01), Kao
“U.S. Appl. No. 11/958,290”, filed Dec. 17, 2007.
“Non Final Office Action”, U.S. Appl. No. 11/958,290, Mailing Date: Aug. 7, 2009.
“Notice of Allowance and Fees Due”, U.S. Appl. No. 11/858,290, Mailing Date: May 6, 2010.
Gaffin Jeffrey A
Gandhi Dipakkumar
IP Strategy Group, P.C.
Wi2Wi, Inc.
LandOfFree
Built-in-self-repair arrangement for a single... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Built-in-self-repair arrangement for a single..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Built-in-self-repair arrangement for a single... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4282483