Test interface for random access memory (RAM) built-in...
Test interface, system, and method for testing...
Test language conversion method
Test limits based on position
Test method and apparatus using energy consumption ratio
Test method and architecture for circuits having inputs
Test method and test circuit for electronic device
Test method for a semiconductor integrated circuit having a...
Test method for high speed semiconductor devices using a...
Test method of chips in a semiconductor wafer employing a test a
Test method of semiconductor intergrated circuit and test...
Test methodology based on multiple skewed scan clocks
Test mode circuit capable of surely resetting test mode signals
Test mode control circuit and method for using the same in...
Test mode features for synchronous pipelined memories
Test mode for pin-limited devices
Test mode setup circuit for microcontroller unit
Test mode soft reset circuitry and methods
Test output compaction for responses with unknown values
Test output compaction using response shaper