Test output compaction using response shaper

Details Test output compaction using response shaper Test output compaction using response shaper

2007-05-22

2007-05-22

Kerveros, James C (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

10985599

ABSTRACT:
A test output compaction architecture and method that takes advantage of a response shaper in order to minimize masking of faults during compaction. A response shaper is inserted between a plurality of scan chains and an output compactor. The response shaper receives output responses from scan chains and reshapes the output responses in a manner that minimizes masking of faults by the output compactor.

REFERENCES:
patent: 6557129 (2003-04-01), Rajski et al.
patent: 2005/0278593 (2005-12-01), Muradali et al.

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