Test language conversion method

Details Test language conversion method Test language conversion method

2005-12-20

2005-12-20

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S738000

Reexamination Certificate

active

06978410

ABSTRACT:
A method of converting test vectors in an original cycle based test language into a target cycle based test language, by forming a set of templates depicting waveforms defined in the target test language, decomposing a waveform in the original test language into a set of constituent events where each event includes data showing at least a starting value and a number of subsequent edges of the waveform, comparing the template and the set of constituent events at different levels of abstraction determined in advance, in the order of a signal level, a wave kind level where the signal is configured by a plurality of wave kinds, and a character level where the wave kind is configured by a plurality of characters, and storing the waveform data in the target test language when a match is detected and retrieving corresponding parameters of the waveform in the original test language.

REFERENCES:
patent: 5778004 (1998-07-01), Jennion et al.
patent: 5845234 (1998-12-01), Testa et al.
patent: 5974241 (1999-10-01), Fusco
patent: 6067652 (2000-05-01), Fusco et al.
patent: 6553529 (2003-04-01), Reichert

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