Test method for a semiconductor integrated circuit having a...

Details Test method for a semiconductor integrated circuit having a... Test method for a semiconductor integrated circuit having a...

2007-07-24

2007-07-24

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

11024463

ABSTRACT:
The test method for a semiconductor integrated circuit includes a multi-cycle test step and a single-cycle test step. In the multi-cycle test step, a data-read side flipflop holds data according to a clock enable signal to test a multi-cycle path. In the single-cycle test step, no data is captured for the multi-cycle path.

REFERENCES:
patent: 6145105 (2000-11-01), Nadeau-Dostie et al.
patent: 6327684 (2001-12-01), Nadeau-Dostie et al.
patent: 6442722 (2002-08-01), Nadeau-Dostie et al.
patent: 2002/0147951 (2002-10-01), Nadeau-Dostie et al.

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