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Built in self test algorithm that efficiently detects...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built in self test for input/output characterization

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built in self test system and method for detecting and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built in self test transport controller architecture

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built off self test (BOST) in the kerf

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in functional tester for search engines

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self diagnosis device for a random access memory...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self repair circuitry utilizing permanent record of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test (BIST) technology for testing field...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test circuit and test method for storage device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test circuit employing a linear feedback shift...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test circuit for analog-to-digital converter...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test circuit for integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test circuitry for process monitor circuit for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test for a thermal processing system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test for content addressable memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test for memory arrays using error correction...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test for speed and timing margin for a source...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test system and method for high speed clock...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self testing circuit with fault diagnostic capability

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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