Built-in self diagnosis device for a random access memory...

Details Built-in self diagnosis device for a random access memory... Built-in self diagnosis device for a random access memory...

2005-08-05

2009-08-04

Lamarre, Guy J (Department: 2112)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S734000, C714S030000, C714S718000

Reexamination Certificate

active

07571367

ABSTRACT:
A self diagnosis (BISD) device for a random memory array, preferably integrated with the random access memory, executes a certain number of predefined test algorithms and identifies addresses of faulty locations. The BISD device recognizes certain fail patterns of interest and generates bit-strings corresponding to them. In practice, the BISD device may diagnose memory arrays and allow the identification of defects in the production process that affect a new technology during its learning phase, thus accelerating its maturation.

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Appello et al., A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques, Memory Technology, Design and Testing, Proceedings of the 2002 IEEE International Workshop on Jul. 10-12, 2002, pp. 12-16.
Chih-Wea et al., A Built-In-Self-Test and Self-Diagnosis Scheme for Embedded SRAM, Proceedings of the Ninth Asian Test Symposium IEEE Comput., SOC. Los Alamitos, CA, 2000, pp. 45-50.

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