IC chip tester using compressed digital test data and a method f

Details IC chip tester using compressed digital test data and a method f IC chip tester using compressed digital test data and a method f

1998-08-26

2000-09-19

Nguyen, Hoa T.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

G01R 3128

Patent

active

061227617

ABSTRACT:
Disclosed are a tester for testing an IC chip using test data consisting of many test vectors and a method for testing an IC chip using the tester. The tester has a pin memory, a sequencer memory, and a driving part. The pin memory stores many data blocks. Each of the test blocks is a combination of one or more test vector, and is repeated at least one time in the test data. The sequencer memory stores information about a designation order of the test blocks for restoring the test data. The driving part drives the pin memory so that the test blocks stored therein are output successively according to the designation order stored in the sequencer memory. The tester does not require an additional CPU, and the programming therefor is simple.

REFERENCES:
patent: 4860260 (1989-08-01), Saito et al.
patent: 4875210 (1989-10-01), Russo et al.
patent: 5606568 (1997-02-01), Sudweeks
patent: 5894484 (1999-04-01), Illes et al.

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