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Built-in self test circuit for analog-to-digital converter...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Built-in self test circuit for integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test circuitry for process monitor circuit for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test for a thermal processing system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test for content addressable memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test for memory arrays using error correction...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test for speed and timing margin for a source...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self test system and method for high speed clock...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self testing circuit with fault diagnostic capability

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self verification circuit for system chip design

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self-analyzer for embedded memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self-test (BIST) for high performance circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self-test apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self-test arrangement for integrated circuit memory...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Built-in self-test circuit for phase locked loops, test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self-test circuit for read channel device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Built-in self-test controlled by a token network and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self-test emulator

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self-test for multi-channel transceivers without...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Built-in self-test for multi-channel transceivers without...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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