Built-in self-analyzer for embedded memory

Details Built-in self-analyzer for embedded memory Built-in self-analyzer for embedded memory

2007-04-03

2007-04-03

Chung, Phung My (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000, C714S039000, C365S201000, C716S030000

Reexamination Certificate

active

10749283

ABSTRACT:
Methods and apparatus for analyzing memory defects in an embedded memory are described. According to certain embodiments, the analysis can be performed “at-speed” and can be used to analyze multi-bit failures in words of a word-oriented memory. According to some embodiments, the analysis comprises updating a record of column defects not repaired by spare rows as the memory is being tested. The record can be evaluated after a test to determine whether a repair strategy can successfully repair a memory-under-test.

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