Clock controller for at-speed testing of scan circuits
Clock delay circuits and multiplexer connected to boundary...
Clock domain test isolation
Clock duty cycle based access timer combined with standard...
Clock generator and method for providing reliable clock...
Clock skew insensitive scan chain reordering
Clock transferring apparatus, and testing apparatus
Clocking methodology for at-speed testing of scan circuits...
Clocking methodology for at-speed testing of scan circuits...
Clustering-based approach for coverage-directed test generation
Combinational test pattern generation method and apparatus
Combinational test pattern generation method and apparatus
Combinatorial at-speed scan testing
Combinatorial at-speed scan testing
Command multiplier for built-in-self-test
Common test logic for multiple operation modes
Communicating simultaneously a functional signal and a...
Communication element and communication apparatus using the...
Communication equipment with boundary scan elements
Communication interface for diagnostic circuits of an...