Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2005-11-30
2009-02-24
Trimmings, John P (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S025000, C714S030000, C714S709000, C714S731000, C714S734000, C714S740000, C714S744000, C714S812000, C714S814000, C713S500000, C702S190000, C703S028000
Reexamination Certificate
active
07496813
ABSTRACT:
An integrated circuit2including functional circuits4, 6and a diagnostic circuit10passes a functional signal and a diagnostic signal to/from the integrated circuit using a shared integrated circuit pin14. The functional signal and the diagnostic signal have relative forms such that they can be simultaneously communicated and respective independent physical communication channels provided therefore. Examples are the diagnostic signal being used to frequency, phase, amplitude or otherwise modulate a functional signal being passed. A diagnostic interface circuit18is provided to recover the diagnostic signal from the combined functional and diagnostic signal or to combine the functional and diagnostic signals.
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“Integrator LM-XCV600E User Guide”, 2001, http://arm.com/.
Houlihane Thomas Sean
Milne George James
ARM Limited
Nixon & Vanderhye P.C.
Trimmings John P
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