Command multiplier for built-in-self-test

Details Command multiplier for built-in-self-test Command multiplier for built-in-self-test

2007-03-20

2007-03-20

Britt, Cynthia (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S731000

Reexamination Certificate

active

10708184

ABSTRACT:
Disclosed is a flexible command multiplication scheme for the built-in-self test (BIST) of a high-speed embedded memory array that segments BIST functionality into remote lower-speed executable instructions and local higher-speed executable instructions. A stand-alone BIST logic controller operates at a lower frequency and communicates with a command multiplier using a low-speed BIST instruction seed set. The command multiplier uses offset or directive registers to drive a logic unit or ALU to generate “n” sets of CAD information which are then time-multiplexed to the embedded memory at a speed “n” times faster than the BIST operating speed.

REFERENCES:
patent: 4903266 (1990-02-01), Hack
patent: 5301156 (1994-04-01), Talley
patent: 5388104 (1995-02-01), Shirotori et al.
patent: 5614838 (1997-03-01), Jaber et al.
patent: 5954830 (1999-09-01), Ternullo, Jr.
patent: 6001662 (1999-12-01), Correale, Jr. et al.
patent: 6055658 (2000-04-01), Jaber et al.
patent: 6294935 (2001-09-01), Ott
patent: 6360342 (2002-03-01), Lee et al.
patent: 6550033 (2003-04-01), Dwork
patent: 6574760 (2003-06-01), Mydill
patent: 6583642 (2003-06-01), Huang et al.
patent: 6611933 (2003-08-01), Koenemann et al.
patent: 6647524 (2003-11-01), Huang et al.
patent: 6928593 (2005-08-01), Halbert et al.
patent: 7032162 (2006-04-01), Dhamankar
patent: 7078495 (1995-03-01), None
patent: 2003229000 (2003-06-01), None
“A 800MHz Embedded DRAM with a Concurrent Refresh Mode”, Toshiaki Kirihata et al., IBM Microelectronics, Hopewell Junction, NY, pp. 1-6.
“Fault Simulation on the YSE/EVE”, Barzilai et al., IBM Technical Disclosure Bulletin, vol. 28, No. 2, Jul. 1985, pp. 773-776.

Affiliated with

Also associated with

Rating

Command multiplier for built-in-self-test does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Command multiplier for built-in-self-test, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Command multiplier for built-in-self-test will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3784463