Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2011-05-10
2011-05-10
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S742000
Reexamination Certificate
active
07941723
ABSTRACT:
A clock generator is disclosed that includes an array of MEMS resonators and a test circuit. The test circuit is operable at start-up to operate one or more of the MEMS resonators to generate test output and analyze the test output to determine whether the operated MEMS resonators meet test criteria. A MEMS resonator is selected that meets the test criteria and its output is used to generate an output clock signal. In addition, the test circuit is operable to analyze the output of the selected MEMS resonator and select a replacement MEMS resonator when the output of the selected MEMS resonator no longer meets the test criteria. The replacement MEMS resonator is then operated and its output is coupled to the output of the clock generator. Thereby, failing and potentially failing MEMS resonators are automatically replaced during operation of the clock generator in its end-use application.
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Lee Jimmy
Lien Chuen-Der
Britt Cynthia
Gandhi Dipakkumar
Glass Kenneth
Glass & Associates
Integrated Device Technology Inc.
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