Combinatorial at-speed scan testing

Details Combinatorial at-speed scan testing Combinatorial at-speed scan testing

2007-09-04

2007-09-04

Chung, Phung My (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S726000, C714S733000, C714S738000

Reexamination Certificate

active

11166432

ABSTRACT:
A processor including a first distributed shift generator associated with a first time domain, wherein the first distributed shift generator is coupled to a first group of scan chains, the first distributed shift generator to send a shift-enable-flop signal to be received by the first group of scan chains. The processor including a second distributed shift generator associated with a second time domain, wherein the second distributed shift generator is coupled to a second group of scan chains, the second distributed shift generator to send a shift-enable-flop signal to be received by the second group of scan chains. The processor including a scan test controller coupled to the first and second distributed shift generators, the scan test controller to provide clocking signals for the first time domain and the second time domain for performing an at-speed test of circuits coupled to the first group of scan chains.

REFERENCES:
patent: 5281864 (1994-01-01), Hahn et al.
patent: 5592493 (1997-01-01), Crouch et al.
patent: 6000051 (1999-12-01), Nadeau-Dostie et al.
patent: 6779142 (2004-08-01), Bhavsar et al.
patent: 6961885 (2005-11-01), Man et al.
patent: 6988232 (2006-01-01), Ricchetti et al.
patent: 2003/0084413 (2003-05-01), Varney
patent: 2003/0093734 (2003-05-01), Zhang et al.
patent: 2004/0064769 (2004-04-01), Gupte et al.
patent: 2004/0267480 (2004-12-01), Day
Samaranayake, S. et al., “Dynamic Scan: Driving Down the Cost of Test,” IEEE, vol. 35, No. 10, Oct. 2002, pp. 63-68.
Neil, Bob, “How to generate at-speed scan vectors,” EE design, May 9, 2003. URL: http://www.eedesign.com/article/showArticle.jhtml?articleId=17408375.
Lin, X. et al., “High-Frequency, At-Speed Scan Testing,” IEEE, vol. 20, No. 5, Sep./Oct. 2003, pp. 17-25.
Swanson, B. et al., “At-speed testing made easy,” EE design, Jun. 3, 2004. URL: http://www.eedesign.com/article/showArticle.jhtml?articleId=21401421.

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