Clustering-based approach for coverage-directed test generation

Details Clustering-based approach for coverage-directed test generation Clustering-based approach for coverage-directed test generation

2007-04-10

2007-04-10

Kerveros, James C (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S724000

Reexamination Certificate

active

10930327

ABSTRACT:
A coverage-directed test generation technique for functional design verification relies on events that are clustered according to similarities in the way that the events are stimulated in a simulation environment, not necessarily related to the semantics of the events. The set of directives generated by a coverage-directed test generation engine for each event is analyzed and evaluated for similarities with sets of directives for other events. Identified similarities in the sets of directives provide the basis for defining event clusters. Once clusters have been defined, a common set of directives for the coverage-directed test generation engine is generated that attempts to cover all events in a given cluster.

REFERENCES:
patent: 6141630 (2000-10-01), McNamara et al.
patent: 6941303 (2005-09-01), Perrizo

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