Target value search circuit, taget value search method, and...
Technique for combining scan test and memory built-in self test
Technique for combining scan test and memory built-in self test
Technique for debugging an integrated circuit having a...
Technique for programming clocks in automatic test system
Technique to decrease the exposure time of infrared imaging...
Technique to detect drive strength of input pin
Technique to test an integrated circuit using fewer pins
Techniques for automatic eye-degradation testing of a...
Techniques for capturing signals at output pins in a...
Techniques for capturing signals at output pins in a...
Techniques for logic built-in self-test diagnostics of...
Techniques for mitigating, detecting and correcting single...
Techniques for mitigating, detecting, and correcting single...
Techniques for mitigating, detecting, and correcting single...
Techniques for performing a Logic Built-In Self-Test in an...
Temperature sampling in electronic devices
Ternary search process
Test access architecture and method of testing a module in...
Test access circuit and method of accessing embedded test...