Techniques for performing a Logic Built-In Self-Test in an...

Details Techniques for performing a Logic Built-In Self-Test in an... Techniques for performing a Logic Built-In Self-Test in an...

2011-01-18

2011-01-18

Tabone, Jr., John J (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S724000, C714S726000, C714S729000, C714S733000, C714S736000, C714S738000, C714S739000, C714S742000, C324S759030, C324S763010, C324S765010

Reexamination Certificate

active

07873890

ABSTRACT:
A method, system and computer program product for performing device characterization Logic Built-In Self-Test (LBIST) in an IC device. Test parameters of the LBIST are saved in a memory of the IC device, and nominal operational parameters of the IC device are used to define a signature of the LBIST. A determination whether the LBIST is passed or failed is made within the characterized IC device.

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Liu et al.; “Compact Dictionaries for Fault Diagnosis in BIST”; Dept. of Electrical & Computer Engineering, Duke University, Durham, NC; Proceedings of the Fourth International Symposium on Quality Electronic Design; IEEE 2003.

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