Techniques for logic built-in self-test diagnostics of...

Details Techniques for logic built-in self-test diagnostics of... Techniques for logic built-in self-test diagnostics of...

2008-04-03

2010-12-21

Tabone, Jr., John J (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S724000, C714S726000, C714S729000, C714S733000, C714S736000, C714S738000, C714S739000, C714S742000, C324S759030, C324S763010, C324S765010

Reexamination Certificate

active

07856582

ABSTRACT:
A method, system and computer program product for performing real-time LBIST diagnostics of IC devices. During LBIST, stump data and identifiers of test cycles are saved in the IC device-under-test (DUT). If compressed stump data does not match a pre-defined coded value (i.e., “signature” of the test cycle), the saved stump data and an identifier of the failed test cycle are preserved, otherwise the determination is made the DUT passed the test cycle. Identifiers and stump of the failed test cycles are used to analyze errors, including virtually non-reproducible errors.

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