Temperature sampling in electronic devices

Details Temperature sampling in electronic devices Temperature sampling in electronic devices

2006-12-29

2010-11-30

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S047300, C714S708000, C714S718000, C714S721000, C365S201000, C365S212000, C711S105000, C702S130000, C700S299000

Reexamination Certificate

active

07844876

ABSTRACT:
In some embodiments the continuous measuring of temperature in remote memory devices operating within an electrically noisy environment is facilitated by coordinating the progressive approximation of temperature within quiescent periods of non-activity as known by a memory controller.

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