Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-07-18
2006-07-18
Decady, Albert (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C702S125000, C713S500000, C708S271000
Reexamination Certificate
active
07080304
ABSTRACT:
A system and method for configuring an automatic test system to produce a plurality of clocks from a reference clock includes a user interface and software. The user interface receives a plurality of inputs that specify desired frequencies of the plurality of clocks. In response to a command from the user interface, the software calculates values for dividers coupled to the reference clock, for deriving each of the desired frequencies from the reference clock. According to one embodiment, the desired frequencies form ratios that must be met to satisfy coherence. In calculating the divider values, the software minimizes frequency errors while precisely preserving the required ratios.
REFERENCES:
patent: 4598257 (1986-07-01), Southard
patent: 5719510 (1998-02-01), Weidner
patent: 5905967 (1999-05-01), Botham
patent: 6223298 (2001-04-01), Tellier et al.
patent: 6333940 (2001-12-01), Baydar et al.
patent: 6449741 (2002-09-01), Organ et al.
patent: 6675339 (2004-01-01), Lanier et al.
patent: 2002/0023239 (2002-02-01), Nomura et al.
patent: WO94/02861 (1994-02-01), None
patent: WO96/28745 (1996-09-01), None
patent: WO01/28100 (2001-04-01), None
S. Max, “Direct AWG Sine Wave Synthesis with Fixed Clock Frequency”, May 1-4, 2000, Proceedings of 17th IEEE, vol. 1 pp230-234.
International Search Report, Mailing Date Aug. 18, 2003.
Mehtani, R. et al, “Mix Test: A Mixed-Signal Extension to a Digital Test System,” Proceedings from International Test Conference 1993, New York NY, Oct. 17, 1993, IEEE, pp. 945-953.
De'cady Albert
Teradyne, Inc.
Trimmings John P.
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