Target value search circuit, taget value search method, and...

Details Target value search circuit, taget value search method, and... Target value search circuit, taget value search method, and...

2003-10-24

2008-10-28

Louis-Jacques, Jacques H (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C707S793000, C707S793000, C365S185030

Reexamination Certificate

active

07444576

ABSTRACT:
In a tentative target value calculation section28, a predetermined value is subtracted from (or added to) a target value Exp to calculate a tentative target value ExpB. In a binary search executing section25, binary search is executed, and a searching region is limited to a certain region including this tentative target value ExpB. Next, in a sequential search executing section29, the target value Exp is searched for in an increasing direction from the tentative target value ExpB which is a start point in the limited searching region. Accordingly, both drop prevention of measurement precision and reduction of searching time are achieved consistently, and a target value is securely and normally found in a case where a sequence constituting a searching object indicates an ascending-order sequence including a decrease in a part.

REFERENCES:
patent: 6643787 (2003-11-01), Zerbe et al.
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patent: 7191373 (2007-03-01), Wang et al.
patent: 2002/0049753 (2002-04-01), Burrows
patent: 2002/0138801 (2002-09-01), Wang et al.
patent: 02-143954 (1990-06-01), None
patent: 2000-131390 (2000-05-01), None
patent: 2002-040091 (2002-02-01), None

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