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Boundary scan latch configuration for generalized scan designs

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary scan method for terminating or modifying integrated cir

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary scan of integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary scan path method and system with functional and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary scan path method and system with functional and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary scan register for differential chip core

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary scan system with address dependent instructions

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary scan test cell circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary scan tester for logic devices

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary scan tester for logic devices

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary scan testing involving shared enable latches

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary scan testing system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary scan with ground bounce recovery

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary scan with latching output buffer and weak input buffer

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Boundary scan with strobed pad driver enable

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary scanning element and communication equipment using...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary-scan method using object-oriented programming language

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary-Scan methods and apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary-scan register cell with bypass circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Boundary-scan test method and device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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