Boundary-Scan methods and apparatus

Details Boundary-Scan methods and apparatus Boundary-Scan methods and apparatus

2002-11-12

2008-10-14

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S030000, C714S724000, C714S732000, C714S726000, C714S729000, C714S742000

Reexamination Certificate

active

07437638

ABSTRACT:
Disclosed herein are various methods and apparatus related to Boundary-Scan testing, including a method for generating Boundary-Scan test vectors. The method assigns different binary signatures to all of the drivers and hysteretic test receiver memories of a circuit assembly under test, and then generates a series of Boundary-Scan test vectors wherein each test vector is derived from corresponding bits of the binary signatures.

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Kenneth P. Parker, “The Boundary-Scan Handbook: Analog and Digital”, 2nd edition, Sep. 1998, pp. 122-131.
“Draft Standard for Boundary-Scan Testing of Advanced Digital Networks”, IEEE P1149.6 Draft 3.1 (Jun. 4, 2002), pp. 1-110.
Eklow, et al.; “A Boundary-Scan Standard for Advanced Digital Networks”; IEEE, Apr. 2002; pp. 1056-1065.

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