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Package parallel test method and apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Packet-based device test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Page — EXE erase algorithm for flash memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Panel driving circuit that generates panel test pattern and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Panel driving circuit that generates panel test pattern and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Parallel backtracing for satisfiability on reconfigurable...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Parallel decompressor and related methods and apparatuses

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Parallel input/output self-test circuit and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Parallel processing pattern generation system for an integrated

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Parallel scan test software

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Parallel signature compression circuit and method for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Parallel test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Parallel test system and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Parallel testing of a multiport memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Parallel testing of integrated circuit devices using...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Parametric measurement of high-speed I/O systems

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Parametric testing for high pin count ASIC

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Partial good integrated circuit and method of testing same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Partial good integrated circuit and method of testing same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Partially distributed control mechanism for scanout...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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