Parametric measurement of high-speed I/O systems

Details Parametric measurement of high-speed I/O systems Parametric measurement of high-speed I/O systems

2006-05-18

2009-08-04

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S025000, C714S030000, C714S056000, C714S709000, C714S712000, C714S716000, C714S738000, C714S744000, C327S141000, C370S395620, C375S221000, C375S215000, C375S213000, C375S226000, C375S229000, C375S371000, C375S376000

Reexamination Certificate

active

07571363

ABSTRACT:
A phase comparator is used to test a device under test comprising an input/output (I/O) circuit by applying a signal to the device under test; extracting a phase signal from the phase comparator; and determining parametric information pertaining to the I/O circuit of the device under test from the phase signal.

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PCT International Search Report dated Oct. 30, 2006.

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