On-chip design for monitor

Details On-chip design for monitor On-chip design for monitor

2006-03-21

2006-03-21

Dildine, R. Stephen (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07017092

ABSTRACT:
A monitoring device on-chip. The monitoring device includes characteristic circuits, test circuits, and select circuits and is incorporated into an integrated circuit. The test circuit is cascaded by the characteristic circuit and a select circuit is incorporated to switch to output the test signal or the characteristic signal. There is another select circuit to switch the output signal of the integrated circuit in a normal mode or the signal of the output end of the characteristic circuit. Therefore, the output end of the select circuit can output the integrated circuit's signals, test signals, and characteristic signals without additional output pins.

REFERENCES:
patent: 2002/0176190 (2002-11-01), Cyrusian
patent: 2003/0018939 (2003-01-01), Kinoshita et al.
Einfeld, J. et al.; A new test circuit for the matching characterization of npn bipolar transistors; Microelectronic Test Structures, 2004. Proceedings. ICMTS '04. The International Conference on , Mar. 22-25, 2004; pp. 127-131.

Affiliated with

Also associated with

Rating

On-chip design for monitor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with On-chip design for monitor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and On-chip design for monitor will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3607715