On-chip and at-speed tester for testing and characterization...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Details

C714S025000, C714S030000, C714S724000, C714S718000, C714S734000, C714S737000, C714S742000, C365S201000

Reexamination Certificate

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11102556

ABSTRACT:
An on-chip and at-speed tester for testing and characterization of different types of memories in an integrated circuit device, comprising a Centralized Flow Controller for automatically controlling the test operations for selected test programs, and Localized Signal Generators located inside each memory block and controlled by said Centralized Flow Controller for applying specified test patterns on the associated memory array.

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