On-chip high-speed serial data analyzers, systems, and...

Details On-chip high-speed serial data analyzers, systems, and... On-chip high-speed serial data analyzers, systems, and...

2008-03-04

2008-03-04

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S799000, C714S812000, C714S821000, C375S236000, C375S286000

Reexamination Certificate

active

11026546

ABSTRACT:
In an embodiment, a method includes forming a plurality of time/voltage points from a number of voltage values and from a number of time values, generating serialized data having a predetermined number of bits, comparing the serialized data to a set predetermined voltage to produce analysis data, and capturing the analysis data at a respective time data point of a plurality of time data points. The method may be implemented as part of integrated circuits, electronic assemblies, or systems.

REFERENCES:
patent: 5644569 (1997-07-01), Walker
patent: 5734341 (1998-03-01), Walker
patent: 5805087 (1998-09-01), Walker
patent: 7089485 (2006-08-01), Azadet et al.

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