Measuring propagation delays of programmable logic devices

Details Measuring propagation delays of programmable logic devices Measuring propagation delays of programmable logic devices

2006-05-02

2006-05-02

Ton, David (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S745000

Reexamination Certificate

active

07039842

ABSTRACT:
Methods are described herein, for improving the accuracy of propagation delay measurements of programmable electronic devices in a production environment. In one method, a built-in self-test is implemented by configuring an oscillator and a counter connected to each other within the PLD. The oscillator is enabled to oscillate for a pre-determined length of time and to cause the counter to count up at the end of each cycle of oscillation. The counter reading is correlated to an accurate propagation delay measurement by using a previously generated counter-delay correlation curve. In other methods, the counter is built outside of the logic of the PLD. Methods are described for adapting typical output macro cells to provide combinatorial feedback for configuring oscillators within PLDs without such capabilities.

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“AC Test Measurement Utilizing Built In Self Test”, Lattice Semiconductor Corporation, Nov. 1999, 2 pages.

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