Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2011-08-16
2011-08-16
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S724000, C702S117000, C365S201000, C703S014000, C716S104000, C716S106000, C716S136000, C716S115000, C324S526000, C324S537000
Reexamination Certificate
active
08001438
ABSTRACT:
A computer-implemented method of measuring bridge fault coverage for a test pattern for a circuit design to be implemented within a programmable logic device can include identifying simulation results and stuck at coverage of the circuit design for the test pattern (610, 620). Pairs of nets in the circuit design that are adjacent can be identified (625). Each type of bridge fault for which each pair is tested can be determined according to the simulation results (640, 645, 655, 660). A measure of bridge fault coverage for the test pattern can be calculated according to which types of bridge faults each pair is tested and which net of each pair acts as an aggressor for each type of bridge fault tested (675). The measure of bridge fault coverage can be output (680).
REFERENCES:
patent: 7363605 (2008-04-01), Kondratyev et al.
patent: 7509600 (2009-03-01), Rajski et al.
patent: 7620853 (2009-11-01), Kasnavi et al.
patent: 2005/0240887 (2005-10-01), Rajski et al.
patent: 2007/0201618 (2007-08-01), Nozuyama
patent: 2007/0260408 (2007-11-01), Nozuyama
patent: 2009/0055787 (2009-02-01), Oh et al.
patent: 2009/0183128 (2009-07-01), Rajski et al.
Xijiang Lin, Janusz Rajski, The Impacts of Untestable Defects on Transition Fault Testing, 2006, IEEE VLSI Test Symposium, pp. 1-6.
Yiming Gong and Sreejit Chakravarty, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 17, No. 9, Sep. 1998.
David B. Lavo, Brian Chess, Tracy Larrabee, and F. Joel Ferguson,Diagnosing Realistic Bridging Faults with Single Stuck-At Information, 1998m, vol. 17.
Britt Cynthia
Cuenot Kevin T.
Maunu LeRoy D.
Merant Guerrier
Xilinx , Inc.
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